January 16, 1990 MEMORANDUM SUBJECT: Refined Metals Lead Modeling Analysis FROM: Joseph A. Tikvart, Chief Source Receptor Analysis Branch (MD-14) TO: Steve Rothblatt, Chief Air and Radiation Branch, Region V (5AR-26) In response to your request the Model Clearinghouse has examined issues associated with particle size distributions, settling velocities and surface reflection at Refined Metals. We agree that the positions you take on each of these issues are appropriate, given the guidance and the case-specific information that appears to be available in this case. The modeling procedures used in Alabama are not relevant since the issues are primarily those of source characterization, which must be established on a case-by-case basis. In specific answer to your questions, the use of the AP-42 size distributions is appropriate. Lacking information to the contrary, we believe that you could also justify your assumption that particles larger than 15 um should be modeled at 15 um in order to produce a conservative air concentration estimate. With regard to the use of the settling velocity equation in the ISC Users Guide, the Guide indicates that the equation is valid for particle densities on the order of 1 g/cm3. While it might be argued that particles containing lead may be heavier than this, it would be up to the Company to establish a more representative density, specific to their plant, then establish that the Users Guide equation is still valid and applicable for that density. Lacking such information it can be reasoned that your position is either realistic or conservative since deposition will either be estimated correctly or slightly underestimated. With regard to the reflection term, we agree that Figure 2-8 of the User's Guide would constitute guidance for determining the reflection coefficient. Assuming that you have properly interpreted that figure for the deposition velocities applicable in this case, we agree with your position. If you have any questions, please contact Dean Wilson at 629-5683. cc: D. deRoeck M. Smith D. Wilson